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Jinzhengmao High and Low Temperature Vacuum Probe Station
Chip testing, material testing, Hall testing, electromagnetic transport characteristics, etc. under high and low temperature vacuum environment of Jin
Product details
High and low temperature vacuum probe station
Product Overview:
Jinzhengmao High and Low Temperature Vacuum Probe StationCapable of conducting high and low temperature tests in a vacuum environment（4.2K~500K）Upgradeable loading magnetic field, low-temperature anti radiation screen design, sample stage adoptsHigh purity oxygen free copperMade with better temperature uniformity, the temperature sensor adopts a material with good stability and repeatabilityPT100Alternatively, calibrated silicon diodes can be used as temperature measuring devices, supporting fiber optic spectral characteristic testing, compatible with high magnification metallographic microscopes, and capable of fine tuning movement. The high-frequency characteristics of the device are also supported(Support frequency up to67GHz)Probe heat sink design,LD/LED/PDThe intensity of light/Wavelength testing, automatic flow control, materials/The device'sIV/CVCharacteristic testing, etc.
Jinzhengmao High and Low Temperature Vacuum Probe StationCapable of conducting high and low temperature tests in a vacuum environment（4.2K~500K）Upgradeable loading magnetic field, low-temperature anti radiation screen design, sample stage adoptsHigh purity oxygen free copperMade with better temperature uniformity, the temperature sensor adopts a material with good stability and repeatabilityPT100Alternatively, calibrated silicon diodes can be used as temperature measuring devices, supporting fiber optic spectral characteristic testing, compatible with high magnification metallographic microscopes, and capable of fine tuning movement. The high-frequency characteristics of the device are also supported(Support frequency up to67GHz)Probe heat sink design,LD/LED/PDThe intensity of light/Wavelength testing, automatic flow control, materials/The device'sIV/CVCharacteristic testing, etc.
Application scope:
Jinzhengmao High and Low Temperature Vacuum Probe StationChip testing, material testing, Hall testing, electromagnetic transport characteristics, etc. in high and low temperature vacuum environments.
Optional attachments:
Vibration resistant table
þMulti-stage compression refrigeration machine
þmechanical pump/Molecular pump group/ion pump
þRF components
þVarious types of frequency vacuum joints
þVarious typesDCProbes, high-frequency probes, active probes, cables, etc
þVarious probe fixtures
þ ChuckMotion device
þElectromagnetic system/superconducting magnet system
þ 1MpaPositive pressure system
þUltra high temperature upgrade option
þUltra high vacuum upgrade option
Technical indicators:
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model |
T81-50probe station |
T80-50probe station |
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Cooling method |
liquid helium/Liquid nitrogen refrigeration |
Closed cycle refrigeration machine |
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Material of the cavity |
Non magnetic stainless steel or aluminum alloy |
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vacuum degree |
Vacuum up to10-8Pa |
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Size of vacuum chamber observation window |
2inch(Optional) |
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Temperature Control Range |
4.2K-450K |
5K-450K |
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Temperature control resolution |
0.001KTemperature controller related |
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Temperature Stability |
0.1KTemperature controller related |
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Cooling time |
40min |
150minInternally, depending on the power of the refrigeration unit |
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temperature sensor |
Silicon diodesPT100（3One sample stage, one probe arm, and one radiation shielding screen |
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Heating power supply |
LVDCLow voltage direct current |
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Sample table material |
Gold plated oxygen free copper |
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Sample table size |
diameter20-50mm, optional100mm |
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Flatness of sample table |
≤7μm |
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Sample table fixing method |
Fixed sample stage (upgradable and movable with displacement stage) |
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Sample table vibration level |
≤50nanometre |
≤1μm(Three level shock absorption) |
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Number of probe arms |
2One4One6One8Optional |
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Probe arm mechanical accuracy |
±12.5mm(Upgradeable ±25mm),accuracy1μm(Optional) |
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Probe type |
Tungsten, beryllium copper, microwave probe (optional up to)67GHzofGSGProbe) |
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Probe adjustment |
Vacuum bellows external adjustment, manual control |
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magnification |
16~100X/20~4000X |
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Microscope travel |
X、Yplane2*2inch, accuracy1μm，ZAxis travel ≥50.8mm |
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Power demand |
220V 50-60Hz |
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